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Bias-Dependent Electron Velocity Extracted From AlGaN/GaN HFETs and Its Impact on gm and fT
Journal:IEEE Electron Device Letters
All the Authors:Yuanjie Lv,Heng Zhou,Peng Cui,Chao Liu
First Author:Mingyan Wang
Indexed by:Journal paper
Correspondence Author:Zhaojun Lin
Translation or Not:no
Date of Publication:2023-10-01