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Main positions:纳电子工程与技术研究中心副主任
Other Post:IEEE高级会员、山东省电子学会专委会秘书长
Degree:Doctoral Degree in Philosophy
Status:Employed
School/Department:集成电路学院

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Philip Zhang

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Gender:Male

Education Level:Postgraduate (Doctoral)

Alma Mater:University of Delaware

Paper Publications

Current position: Home / Scientific Research / Paper Publications
A Universal Approach to Determine the Atomic Layer Numbers in Two-Dimensional Materials Using Dark-Field Optical Contrast
Date of Publication:2023-07-26 Hits:

Affiliation of Author(s):集成电路学院
Journal:Nano Letters
Document Code:02EEAECCCB3E41D7B5C42C3AFFA5C0BC
Volume:23
Issue:19
Page Number:9170
Number of Words:5
Translation or Not:no
Date of Publication:2023-07-26
Date of Publication:2023-07-26

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