Yifei Philip Zhang
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A Universal Approach to Determine the Atomic Layer Numbers in Two-Dimensional Materials Using Dark-Field Optical Contrast
  • Affiliation of Author(s):
    集成电路学院
  • Journal:
    Nano Letters
  • Document Code:
    02EEAECCCB3E41D7B5C42C3AFFA5C0BC
  • Volume:
    23
  • Issue:
    19
  • Page Number:
    9170
  • Number of Words:
    5
  • Translation or Not:
    no
  • Date of Publication:
    2023-07-26

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