Effective suppression of Current collapse in AlGaN/GaN MISHEMTs using in-situ SiN gate dielectric and PECVD SiN passivation
发布时间:2022-12-26
点击次数:
- 发表刊物:
- International Conference on Compound Semiconductor Manufacturing Technology (CSMANTECH), Miami, Florida, USA, May 16-19
- 全部作者:
- Xing Lu,Chao Liu
- 第一作者:
- Huaxing Jiang
- 通讯作者:
- Kei May Lau
- 是否译文:
- 否
- 发表时间:
- 2016-05-01