Effect of Polarization Coulomb Field Scattering on Electrical Properties of the 70-nm Gate-Length AlGaN/GaN HEMTs

Release time:2019-10-25|Hits:

Affiliation of Author(s):微电子学院

Journal:scientific reports

All the Authors:刘欢,Cheng Aijie

First Author:崔鹏

Indexed by:综合研究

Correspondence Author:linzhaojun

Document Code:E7C0F50A9F8C4498BFABA944F654DD32

Volume:8

Translation or Not:no

Date of Publication:2018-08-01