Title:用于检测痕量铜离子的电化学发光传感器及其检测方法
Disigner of the Invention:高文跃,杨鸿业
State of Patent:Authorized patents
Application Number:202411781016.0
Authorization Number:ZL202411781016.0
Service Invention or Not:Yes
Application Date:2024-12-05
Publication Date:2025-03-18
Release Time:2026-01-27