Title : Quantum Mechanism of Insulation Degradation Induced by Charge Relaxation in Silicone Gel Under the Ultrafast Pulsed Electric Field
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Affiliation of Author(s):电气工程学院
Title of Paper:Quantum Mechanism of Insulation Degradation Induced by Charge Relaxation in Silicone Gel Under the Ultrafast Pulsed Electric Field
First Author:高腾
Document Code:03FEADC3E259407FB10E96AE5BEF2179
Number of Words:3
Translation or Not:no
Date of Publication:2023-05-26
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