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Fast aberration compensation based on sequential shift and differential-integral based algorithm in digital holographic microscopy

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Affiliation of Author(s):山东大学

Journal:Optics Communications

Key Words:ROTATION ABSOLUTE MEASUREMENT; PRINCIPAL COMPONENT ANALYSIS; SURFACE METROLOGY; SPHERICAL SURFACE; CELLS; RECONSTRUCTION; CONTRAST; FIGURE

Abstract:Digital holographic microscopy is a high-precision, high-resolution quantitative detection method, however, aberration compensation significantly increases the data processing time. We herein propose a method based on sequential shift and a differential-integral algorithm to compensate for fast phase aberrations. The proposed method obtains the phase derivative of the real sample phase information through holograms at different positions and then reconstructs the aberration-free phase result through integration. The compensation avoids complex phase polynomial fitting calculations or optimization iterations, achieves extremely fast aberration compensation, and can theoretically eliminate various low and high-order aberrations, including extremely complex aberrations. We experimentally validate the effectiveness and high speed of the proposed method by imaging paramecium samples.

All the Authors:Jiantai Dou,Zhaojun Liu

First Author:Weilin He

Indexed by:Article

Correspondence Author:Zhongming Yang

Discipline:Engineering

First-Level Discipline:Optical Engineering

Document Type:J

Volume:507

ISSN No.:0030-4018

Translation or Not:no

Date of Publication:2022-03-01

Included Journals:SCI

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