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所属单位：山东大学

发表刊物：IEEE Photonics Journal

关键字：Aberration compensation, digital holography, interference microscopy, phase measurement.

摘要：We propose a novel absolute calibrate method for digital holographic microscopy with the sequential shift method using Chebyshev polynomials. We separate the object phase and the aberrations by sequential shifting the sample twice in vertical plane of the optical axis. The aberrations phase is then calculated using the high order Chebyshev polynomials. The correct phase is obtained by subtracting the aberrations from the original phase containing the aberration. This method can compensate for the complex aberrations including high-order aberrations without changing the traditional optical system. Meanwhile, it can effectively protect the medium and high frequency information of the specimen in the phase image. Numerical simulation and experimental results demonstrate the availability and advantages of the absolute calibrate method.

全部作者：Jiantai Dou,Zhenhua Liu,Zhaojun Liu

第一作者：Weilin He

论文类型：文章

通讯作者：Zhongming Yang

学科门类：工学

一级学科：光学工程

文献类型：J

卷号：12

期号：1

ISSN号：1943-0655

是否译文：否

发表时间：2019-11-01

收录刊物：SCI