中文

In Situ Monitoring Charge Transfer on Topotactic Epitaxial Heterointerface for Tetracycline Degradation at the Single-Particle Level

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  • Affiliation of Author(s):晶体材料研究院

  • Journal:ACS Catal.

  • Key Words:epitaxial heterojunction;single-particle spectroscopy;charge transfer;FLIM;crystal facet

  • First Author:李蓓

  • Document Code:1557661089592934402

  • Number of Words:5000

  • Translation or Not:no

  • Date of Publication:2022-07-01

  • Date of Publication:2022-07-01

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