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An In Situ Reflectance Spectroscopic Investigation to Monitor Two-Dimensional MoS2 Flakes on a Sapphire Substrate

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Affiliation of Author(s):控制科学与工程学院

Journal:MATERIALS

First Author:王译那

Document Code:56FFB185C45442C39936D798F0417513

Volume:13

Issue:24

Number of Words:5

Translation or Not:no

Date of Publication:2020-12-01

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