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一种测量非线性光学系数的z扫描测量装置及测量方法
  • Affilication of Author(s):
    化学与化工学院
  • Type of Patent:
    发明
  • Application Number:
    202210083283.5
  • Number of Inventors:
    2
  • Service Invention or Not:
    no
  • Application Date:
    2022-01-25
  • Publication Date:
    2024-06-11
  • Authorization Date:
    2024-06-11
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