Affiliation of Author(s):信息科学与工程学院
Journal:MICROELECTRONICS RELIABILITY
Key Words:Electro-thermal coupling;I-V-T relation;Light-emitting diode;System-level performance estimation
First Author:孟皓天
Document Code:1539149461034426369
Volume:129
Number of Words:20
Translation or Not:no
Date of Publication:2022-02-01