Title : The Principles and Applications of Electrical Characterization Techniques for Electrically Active Defects in 4H-SiC Devices

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Affiliation of Author(s):新一代半导体材料研究院

Title of Paper:The Principles and Applications of Electrical Characterization Techniques for Electrically Active Defects in 4H-SiC Devices

Journal:Physica Status Solidi A-Applications and Materials Science

First Author:罗兰

Document Code:1906642867614052353

Number of Words:8

Translation or Not:no

Date of Publication:2025-01-01