Li Shuqiang   

Title:Professor

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Patents

Title of Award : 一种确定GaN晶体管纳米尺寸栅长二维电子气面密度的方法

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Title:一种确定GaN晶体管纳米尺寸栅长二维电子气面密度的方法

Institution:新一代半导体材料研究院

Type of Patent:Invent

Application Number:202310430551.0

Number of Inventors:8

Service Invention or Not:No

Application Date:2023-04-18

Publication Date:2024-01-30

Authorization Date:2024-01-30

Release Time:2024-05-18

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