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In-plane strain states of standard and flip-chip GaN epilayers

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Affiliation of Author(s):晶体材料研究所

Journal:The European Physical Journal Applied Physics

First Author:Duo Liu

Indexed by:Unit Twenty Basic Research

Document Code:lw-91967

Volume: 54 ,

Issue:10101

Translation or Not:no

Date of Publication:2011-01-11

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