In-plane strain states of standard and flip-chip GaN epilayers
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Institution:晶体材料研究院（晶体材料全国重点实验室）
Title of Paper:In-plane strain states of standard and flip-chip GaN epilayers
Journal:The European Physical Journal Applied Physics
First Author:Duo Liu
All the Authors:Duo Liu
Document Code:lw-91967
Volume:54 ,
Issue:10101
Number of Words:3
Translation or Not:No
Date of Publication:2011-01
Release Time:2019-10-24