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Patents

Title : 以X射线单次测量实现对称性微纳米样品三维成像的方法

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Title:以X射线单次测量实现对称性微纳米样品三维成像的方法

Affilication of Author(s):晶体材料研究所

Disigner of the Invention:jianghuaidong

Type of Patent:发明

Application Number:201310479860.3

Number of Inventors:8

Service Invention or Not:no

Application Date:2013-10-14

Publication Date:2015-08-05

Authorization Date:2013-10-14

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