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一种基于深度学习的不规则形状光学元件面形的旋转平移绝对检测方法、设备及存储介质

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  • Affilication of Author(s):信息科学与工程学院

  • Type of Patent:发明

  • Application Number:202110876438.6

  • Number of Inventors:2

  • Service Invention or Not:no

  • Application Date:2021-07-30

  • Publication Date:2022-06-28

  • Authorization Date:2022-06-28

  • Publication Date:2022-06-28

  • Application Date:2021-07-30

  • Authorization Date:2022-06-28
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