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Institution:信息科学与工程学院
Title of Paper:The damage analysis of Nd:YVO4 crystal implanted by He + ions at low energy
Journal:2012 International Symposium on Photonics and Optoelectronics, SOPO 2012
Key Words:Annealing;Atomic force microscopy;Crystals;Optoelectronic devices;Photoluminescence;Photonics;Rutherford backscattering spectroscopy
First Author:Ma, Yujie
Document Code:1395300583568576514
Number of Words:7000
Translation or Not:No
Date of Publication:2012-01
Release Time:2022-12-22