中文

Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry

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  • Affiliation of Author(s):信息科学与工程学院

  • Journal:Optics & Laser Technology

  • All the Authors:wangyurong,mengxiangfeng,Yang Xiulun,wangqingpu

  • First Author:wangyurong

  • Indexed by:Unit Twenty Basic Research

  • Document Code:lw-163364

  • Volume:56

  • Page Number:241

  • Translation or Not:no

  • Date of Publication:2014-02-01

  • Date of Publication:2014-02-01

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