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用于获取单颗粒荧光-微观形貌的置样系统及方法
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Title: : 用于获取单颗粒荧光-微观形貌的置样系统及方法

Affilication of Author(s): : 晶体材料研究所

Patent Applicant: : Zhaoke Zheng,Huang Baibiao,zhangxiaoyang,wangzeyan,wangpeng,liuyuanyuan,zhangqianqian,qinxiaoyan

Type of Patent: : 发明

Application Number: : 201811074855.3

Number of Inventors: : 8

Service Invention or Not: : no

Application Date: : 2018-09-14

Publication Date: : 2020-06-02

Authorization Date: : 2020-06-02

Personal information

Engineer

Gender : Female

Status : Employed

School/Department : 晶体材料研究院

Date of Employment : 1985-07-01

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