Title:用于获取单颗粒荧光-微观形貌的置样系统及方法
Institution:晶体材料研究院（晶体材料全国重点实验室）
Type of Patent:Invent
Application Number:201811074855.3
Number of Inventors:8
Service Invention or Not:No
Application Date:2018-09-14
Publication Date:2020-06-02
Authorization Date:2020-06-02
Release Time:2019-04-15
Engineer
Gender : Female
Status : Employed
School/Department : 晶体材料研究院
Date of Employment : 1985-07-01
Faculty/School : Institute of Crystal Materials
The Last Update Time : ..
