Paper Publications
Affiliation of Author(s):计算机科学与技术学院
Journal:IEEE Transactions on CAD of Integrated Circuits and Systems (TCAD)
Key Words:Accelerator;Deep neural networks (DNNs);Resistive random access memory (ReRAM);Reuse;Weight pattern repetitions (WPRs)
First Author:Zhang, Yuhao
Document Code:1403165945001676802
Volume:41
Issue:4
Page Number:922-935
Translation or Not:no
Date of Publication:2022-04-01
Date of Publication:2022-04-01
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