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Charge-trapping memory based on tri-layer alumina gate stack and InGaZnO channel
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Institution:集成电路学院

Title of Paper:Charge-trapping memory based on tri-layer alumina gate stack and InGaZnO channel

Journal:SEMICONDUCTOR SCIENCE AND TECHNOLOGY

First Author:马鹏飞

Document Code:419298800B7E4787B96E7EF0679BE71C

Volume:35

Issue:5

Number of Words:5000

Translation or Not:No

Date of Publication:2020-05

Release Time:2022-01-18

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Supervisor of Doctorate Candidates
Supervisor of Master's Candidates

Alma Mater : 山东大学

Education Level : Postgraduate (Doctoral)

Degree : Doctor

Status : Employed

School/Department : 集成电路学院

Faculty/School : School of Integrated Circuits,Shandong University

Business Address : 软件园校区

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