Institution:集成电路学院
Title of Paper:A Universal Approach to Determine the Atomic Layer Numbers in Two-Dimensional Materials Using Dark-Field Optical Contrast
Journal:Nano Letters
Document Code:02EEAECCCB3E41D7B5C42C3AFFA5C0BC
Volume:23
Issue:19
Page Number:9170
Number of Words:5
Translation or Not:No
Date of Publication:2023-07
Release Time:2023-11-12
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Alma Mater : 山东大学
Education Level : Postgraduate (Doctoral)
Degree : Doctor
Status : Employed
School/Department : 集成电路学院
Faculty/School : School of Integrated Circuits,Shandong University
Business Address : 软件园校区
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