Title: : 一种使用暗场光学成像技术判别二维材料层数的方法
Affilication of Author(s): : 集成电路学院
Type of Patent: : 发明
Application Number: : 202211106087.1
Number of Inventors: : 4
Service Invention or Not: : no
Application Date: : 2022-09-09
Publication Date: : 2023-10-31
Authorization Date: : 2023-10-31
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Alma Mater : 山东大学
Education Level : Postgraduate (Doctoral)
Degree : Doctor
Status : Employed
School/Department : 集成电路学院
Business Address : 软件园校区
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