Title:一种使用暗场光学成像技术判别二维材料层数的方法
Institution:集成电路学院
Type of Patent:Invent
Application Number:202211106087.1
Number of Inventors:4
Service Invention or Not:No
Application Date:2022-09-09
Publication Date:2023-10-31
Authorization Date:2023-10-31
Release Time:2023-11-01
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Alma Mater : 山东大学
Education Level : Postgraduate (Doctoral)
Degree : Doctor
Status : Employed
School/Department : 集成电路学院
Faculty/School : School of Integrated Circuits,Shandong University
Business Address : 软件园校区
Email :
Email :
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