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Affiliation of Author(s):计算机科学与技术学院
Journal:IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS
Key Words:Analytical models;Compatibility modeling;Context modeling;Convolution;fashion analysis;Feature extraction;Image synthesis;image synthesis;Task analysis;Training;try-on-enhanced scheme
First Author:董雪
Document Code:1539148716587409409
Number of Words:10
Translation or Not:no
Date of Publication:2022-01-01