Title : Stability Analysis of the Grid tied VSC Considering the Influence of Short Circuit Ratio and X/R

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Affiliation of Author(s):电气工程学院

Title of Paper:Stability Analysis of the Grid tied VSC Considering the Influence of Short Circuit Ratio and X/R

Journal:IEEE Transactions on Circuits and Systems II: Express Briefs

First Author:孙媛媛

Document Code:946CF8D86B6247CF893FF96C252F7B8B

Issue:1

Number of Words:9

Translation or Not:no

Date of Publication:2022-01-12