Characterization of ZnSiP2 Films Grown on Si Substrate by Liquid Phase Epitaxy: Morphology, Composition, and Interface Microstructure

Release time:2019-10-25|Hits:

Affiliation of Author(s):晶体材料研究院

Journal:CRYSTAL GROWTH & DESIGN

All the Authors:zhangguodong,Xutang Tao

First Author:张龙振

Document Code:86084AEB972D4A3F9212BB896A81A950

Volume:19

Issue:7

Page Number:3681

Number of Words:5000

Translation or Not:no

Date of Publication:2019-06-04