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Characterization of ZnSiP2 Films Grown on Si Substrate by Liquid Phase Epitaxy: Morphology, Composition, and Interface Microstructure
Release Time:2019-10-25
  • Institution:
    晶体材料研究院（晶体材料全国重点实验室）
  • Journal:
    CRYSTAL GROWTH & DESIGN
  • First Author:
    张龙振
  • All the Authors:
    张国栋,Xutang Tao
  • Document Code:
    86084AEB972D4A3F9212BB896A81A950
  • Volume:
    19
  • Issue:
    7
  • Page Number:
    3681
  • Number of Words:
    5000
  • Translation or Not:
    No
  • Date of Publication:
    2019-06
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