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多光谱多参量光刺激离体细胞膜电位检测系统和方法
Release Time:2022-12-03
  • Institution:
    集成电路学院
  • Type of Patent:
    Invent
  • State of Patent:
    Authorized patents
  • Application Number:
    202111111952.7
  • Number of Inventors:
    5
  • Service Invention or Not:
    No
  • Application Date:
    2021-09-18
  • Publication Date:
    2022-11-15
  • Authorization Date:
    2022-11-15
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