Comparative Study of Short-Channel Effects Between Source-Gated Transistors and Standard Thin-Film Transistors
Release time:2022-05-24
Hits:
- Affiliation of Author(s):
- 集成电路学院
- Journal:
- IEEE Transactions on Electron Devices
- First Author:
- 王震泽
- Document Code:
- EE891ACF871F4DC799BF2F59A5BD422D
- Issue:
- 69
- Number of Words:
- 3000
- Translation or Not:
- no
- Date of Publication:
- 2022-01-13