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显微组件下大行程低温漂的低温微纳米压痕测试系统

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  • Affilication of Author(s):吉林大学

  • First Author:赵宏伟

  • Patent Applicant:王赵鑫

  • Type of Patent:Invent

  • State of Patent:Authorized patents

  • Authorization number:ZL 2018 1 0336308.1

  • Service Invention or Not:no

  • Authorization Date:2022-04-01

  • Authorization Date:2022-04-01
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