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变温工况下可溯源的原位微纳米压痕测试仪器及方法

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  • Affilication of Author(s):吉林大学

  • First Author:赵宏伟

  • Patent Applicant:王赵鑫

  • Type of Patent:Invent

  • State of Patent:Authorized patents

  • Authorization number:ZL202010674815.3

  • Service Invention or Not:no

  • Authorization Date:2024-07-09

  • Authorization Date:2024-07-09
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