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Leveraging balanced logic gates as strong PUFs for securing IoT against malicious attacks

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Affiliation of Author(s):集成电路学院

Journal:JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Document Code:85EAFC79D7014C3987D8B774507AC77C

Issue:6

Number of Words:41

Translation or Not:no

Date of Publication:2019-12-04

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