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Neural Network-Based Entropy: A New Metric for Evaluating Side-Channel Attacks

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Affiliation of Author(s):集成电路学院

Journal:JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS

Key Words:entropy;measurement-to-disclose (MTD);Neural network (NN);side-channel attacks (SCAs)

First Author:程佳风

Document Code:1574962675558338561

Number of Words:10000

Translation or Not:no

Date of Publication:2023-02-01

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