Neural Network-Based Entropy: A New Metric for Evaluating Side-Channel Attacks
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Institution:集成电路学院
Title of Paper:Neural Network-Based Entropy: A New Metric for Evaluating Side-Channel Attacks
Journal:JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS
Key Words:entropy;measurement-to-disclose (MTD);Neural network (NN);side-channel attacks (SCAs)
First Author:程佳风
Document Code:1574962675558338561
Number of Words:10000
Translation or Not:No
Date of Publication:2023-02
Release Time:2024-01-06