Shuang Xie received her PhD degree from University of Toronto, Canada, in Electrical Engineering, in 2014. She had been a postdoctoral researcher with Electronic Instrumentation Lab, Delft University of Technology, the Netherlands, between 2015 and 2019. She was a analog circuit designer with imec, Belgium between 2019 and 2020. In December 2020, she joined School of Microelectronics, Shandong University as a research Professor. Until now, as a first-author, she has published 14 SCI-indexed journal papers (including 2 IEEE TCAS II), and 23 EI-index papers. Her research area include: analog integrated circuit design, analog-to-digital converters (SAR, pipelined, delta-sigma), CMOS image sensors, integrated temperature sensors and thermal management. Email:

Educational Experience
  • 2003/09/01-2007/07/17
    Tianjin University
    Undergraduate (Bachelor’s degree)
  • 2007/09/01-2009/06/09
    Tianjin University
    Master's degree completion
  • 2009/09/09-2014/06/18
    University of Toronto
    Electrical Engineering
    Doctor of Philosophy
Work Experience
  • 2015-6 — 2019-6
     Delft University of Technology 
    Postdoctoral Researcher
  • 2019-6 — 2020-7
     imec, Belgium 
    Analog Circuit Designer
  • 2020-12 — Now
     School of Microelectronics  Shandong University 
    Research Professor
Research Situation

Her research area include: Analog Integrated Circuit Design, SAR/pipelined/delta-sigma ADC, CMOS image sensor, Integrated temperature sensor and VLSI thermal management. She proposed a Digial Error Correction method which alleviatesthe ADC's incomplete settling errors, hence improving conversion rate while maintaining accuracy. Meantime, she proposed employing each of the classical 4 transistor (4T) pinned photodiode (PPD) CMOS image sensor (CIS) pixels, for both imaging and temperature measurement,intended for compensating the CIS's dark current. Both works are published in IEEE TCAS II in 2020, separately.

Achievements in Scientific Research
Research direction

(1) 谢爽. A 0.7 V R-2R SAR ladder-based temperature sensor with less supply sensitivity .《ELECTRONICS LETTERS》 .2022 ,58 (14):536

(2) 谢爽. BJT induced dark current in CMOS image sensors .INTEGRATION-THE VLSI JOURNAL .2022 ,87 (87):260

(3) 谢爽. A Predictive Noise Shaping SAR ADC with Redundancy .JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS .2022 ,31 (17)

(4) Zhao, Yanan. Temperature characteristics testing and modifying of piezoelectric composites .MICROELECTRONIC ENGINEERING .2021 ,242

(5) Hou, Wei. Prospects and Challenges of Flexible Stretchable Electrodes for Electronics .coatings .2022 ,12 (5)

(6) 谢爽. The Design Considerations and Challenges in MOS-Based Temperature Sensors: A Review .ELECTRONICS .2022 ,11 (7)

(7) 谢爽. A digital foreground calibration method for SAR ADCs with redundancy .IEICE Electronics express .2022

(8)  Xie,Shuang,. "A 10 bit 5 MS/s column SAR ADC with digital error correction for CMOS image sensors" .IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS .2020 ,67 (6):984-988

(9)  Xie,Shuang,. “A CMOS image sensor with a 10 MHz column readout speed using digitally calibrated pipelined ADCs” .Microelectronics Journal .2020 ,99 (1):104758

(10)  Xie,Shuang,. "A CMOS Image Sensor with Thermal Sensing Capability and Column Zoom ADCs" .IEEE Sensors Journal .2020 ,20 (5):2398-2404

(11)  Xie,Shuang,. “A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation,” .IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS .2020 ,67 (2):244-259

(12)  Xie,Shuang,. "Suppression of spatial and temporal noise in a CMOS image sensor,” IEEE Sensors Journal" .IEEE Sensors Journal .2020 ,20 (1):162-170

(13)  Xie,Shuang,. “All-MOS self-referenced temperature sensor” .Electronics Letters .2019 ,55 (19):1045-1047

(14)  Xie,Shuang,. “On-chip Smart Temperature Sensors for Dark Current Compensation in CMOS Image Sensors” .IEEE Sensors Journal .2019 ,19 (18):7849-7860

(15)  Xie,Shuang,. "Compensation for Process and Temperature Dependency in a CMOS Image Sensor" .Sensors .2019 ,19 (4):870

(16)  Xie,Shuang. “An all-digital self-calibrated delay-line based temperature sensor for VLSI thermal sensing and management” .Integration, the VLSI Journal .2015 ,51 (1):107-117

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