Title:基于高光谱技术分析的隧道内不良地质体识别系统与方法
Institution:岩土与地下工程研究院
Type of Patent:Invent
Application Number:202010070787.4
Number of Inventors:2
Service Invention or Not:No
Application Date:2020-01-21
Publication Date:2021-04-13
Authorization Date:2021-04-13
Release Time:2024-10-01