一种RFID系统密集环境性能的测试装置及其工作方法

Release time:2019-04-16|Hits:

Affilication of Author(s):信息科学与工程学院

Patent Applicant:Wang Hongjun,yangyang

Type of Patent:发明

Application Number:201611194361X

Number of Inventors:2

Service Invention or Not:no

Application Date:2016-12-21