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辛磊, 杨忠明*, 孟君, 刘兆军. 基于损伤程度量化评估的光学薄膜元件激光损伤阈值测量方法[J]. 红外与激光工程, 2024, 53(3): 20230614-1-20230614-10.

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Pre One:何伟林, 杨忠明*, 张行愚, 刘兆军. 数字全息显微中相位像差校正技术综述[J]. 应用光学, 2024, 45(2): 249-261.

Next One:Xin L, Yang Z*, Liu Z. A white-light interferometry method for 3D measurement of compactly spaced micro-nano structural units[J]. Optics & Laser Technology, 2024, 170: 110264.

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