Date of Publication:2023-02-01 Hits:
Affiliation of Author(s):集成电路学院
Journal:JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS
Key Words:entropy;measurement-to-disclose (MTD);Neural network (NN);side-channel attacks (SCAs)
First Author:程佳风
Document Code:1574962675558338561
Number of Words:10000
Translation or Not:no
Date of Publication:2023-02-01
Date of Publication:2023-02-01