Journal:IEEE Transactions on Industrial Informatics【中科院1区TOP, IF=11.7】

Key Words:Domain adversarial, high-end machineries,open-set fault diagnosis, transfer learning

All the Authors:Xiangyi Geng,Longqing Fan,Mingshun Jiang

First Author:Fuzheng Liu

Indexed by:Journal paper

Correspondence Author:Faye Zhang*

Discipline:Engineering

First-Level Discipline:Control Science and Engineering

Document Type:J

Volume:21

Issue:3

Page Number:2758-2766

Number of Words:35000

Translation or Not:no

Date of Publication:2025-03-01

Included Journals:SCI