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Enhancing Event-Driven Load Shedding by Corrective Switching With Transient Security and Overload Constraints

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  • Affiliation of Author(s):电气工程学院

  • Journal:IEEE Access（二区）

  • All the Authors:Zhang Hengxu

  • First Author:Fang

  • Indexed by:Unit Twenty Basic Research

  • Document Code:B45C99E721E8485AB8BD5A8E6C6376D4

  • Translation or Not:no

  • Date of Publication:2019-07-16

  • Date of Publication:2019-07-16
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