Title : Comparative Study of Short-Channel Effects Between Source-Gated Transistors and Standard Thin-Film Transistors

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Affiliation of Author(s):微电子学院

Title of Paper:Comparative Study of Short-Channel Effects Between Source-Gated Transistors and Standard Thin-Film Transistors

Journal:IEEE Transactions on Electron Devices

First Author:王震泽

Document Code:EE891ACF871F4DC799BF2F59A5BD422D

Issue:69

Number of Words:3000

Translation or Not:no

Date of Publication:2022-01-13