Title:Professor
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Main positions:NMEC1研究所主任
Title : 一种使用暗场光学成像技术判别二维材料层数的方法
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Title:一种使用暗场光学成像技术判别二维材料层数的方法
Affilication of Author(s):集成电路学院
Type of Patent:发明
Application Number:202211106087.1
Number of Inventors:4
Service Invention or Not:no
Application Date:2022-09-09
Publication Date:2023-10-31
Authorization Date:2023-10-31
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