Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector
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Institution:前沿交叉科学青岛研究院
Title of Paper:Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector
Journal:Nuclear Inst. andMethods in Physics Research, A
Document Code:1737383172977913857
Volume:1059
Number of Words:10
Translation or Not:No
Date of Publication:2024-02
Release Time:2024-05-21