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Title:波片相位延迟光谱特性的测量装置
Institution:信息科学与工程学院
Type of Patent:Utility models
Application Number:201320202248.7
Number of Inventors:1
Service Invention or Not:No
Application Date:2013-04-19
Publication Date:2013-09-04
Authorization Date:2013-09-04
Release Time:2019-04-15
