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A Universal Approach to Determine the Atomic Layer Numbers in Two-Dimensional Materials Using Dark-Field Optical Contrast

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Affiliation of Author(s):集成电路学院

Journal:Nano Letters

Document Code:02EEAECCCB3E41D7B5C42C3AFFA5C0BC

Volume:23

Issue:19

Page Number:9170

Number of Words:5

Translation or Not:no

Date of Publication:2023-07-26

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