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Title:一种阻抗/导纳测量误差的评估方法及系统
Institution:电气工程学院
Type of Patent:Invent
Application Number:202510756655.X
Number of Inventors:2
Service Invention or Not:No
Application Date:2025-06-09
Publication Date:2025-09-05
Authorization Date:2025-09-05
Release Time:2025-09-29