Paper Publications
Reliability estimation of thin film platinum resistance MEMS thermal mass flowmeter by step-stress accelerated life testing
2023-06-17 Hits:
Affiliation of Author(s):光学高等研究中心
Journal:MICROELECTRONICS RELIABILITY
First Author:康乔乔
Document Code:80E3D72A6985437E903AC925F733B1E6
Issue:147
Number of Words:5
Translation or Not:no
Date of Publication:2023-06-17
Date of Publication:2023-06-17
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