Paper Publications
Reliability estimation of thin film platinum resistance MEMS thermal mass flowmeter by step-stress accelerated life testing
2023-08-01 Hits:
Affiliation of Author(s):光学高等研究中心
Journal:MICROELECTRONICS RELIABILITY
First Author:康乔乔
Document Code:A098C9B322E44912A81431198F6A54DF
Volume:147
Number of Words:4200
Translation or Not:no
Date of Publication:2023-08-01
Date of Publication:2023-08-01
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