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Reliability estimation of thin film platinum resistance MEMS thermal mass flowmeter by step-stress accelerated life testing
2023-08-01  Hits:

Affiliation of Author(s):信息科学与工程学院
Journal:MICROELECTRONICS RELIABILITY
First Author:康乔乔
Document Code:E59E0304504E413BAD161523BBEDEB15
Issue:147
Number of Words:5
Translation or Not:no
Date of Publication:2023-08-01
Date of Publication:2023-08-01